橢圓光度法 pdf epub mobi txt 電子書下載 2024

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Fujiwara, Hiroyuki

John Wiley & Sons Inc

2007-1

369

1717.60元

HRD

9780470016084

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发表于2024-11-24

橢圓光度法 epub 下載 mobi 下載 pdf 下載 txt 電子書下載 2024

橢圓光度法 pdf epub mobi txt 電子書下載 2024

圖書描述

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE). Beginning with an overview of SE technologies the text moves on to focus on the data analysis of results obtained from SE, Fundamental data analyses, principles and physical backgrounds and the various materials used in different fields from LSI industry to biotechnology are described. The final chapter describes the latest developments of real-time monitoring and process control which have attracted significant attention in various scientific and industrial fields.

橢圓光度法下載 mobi epub pdf txt 電子書