VLSI Test Principles and Architectures pdf epub mobi txt 电子书下载 2026

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出版者:Elsevier Science Ltd

作者:Wang, Laung-terng (EDT)/ Wu, Cheng-Wen (EDT)/ Wen, Xiaoqing (EDT)

出品人:

页数:808

译者:

出版时间:2006-7

价格:620.00元

装帧:HRD

isbn号码:9780123705976

丛书系列:

图书标签:

VLSI
可测性设计
计算机体系结构
计算机
英文
微电子
体系结构
EE
VLSI测试
测试原理
测试架构
数字电路测试
集成电路测试
DFT
可测试性设计
故障建模
测试生成
边界扫描

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.