Reliability Wearout Mechanisms in Advanced CMOS Technologies pdf epub mobi txt 电子书下载 2024

☆☆☆☆☆
简体网页||繁体网页

Strong, Alvin W./ Wu, Ernest Y./ Vollertsen, Rolf-peter/ Sune, Jordi/ La Rosa, Guiseppe

2009-8

624

1204.00 元

9780471731726

图书标签:

喜欢 Reliability Wearout Mechanisms in Advanced CMOS Technologies 的读者还喜欢

下载链接在页面底部

点击这里下载

facebook linkedin mastodon messenger pinterest reddit telegram twitter viber vkontakte whatsapp 复制链接

想要找书就要到小哈图书下载中心

qciss.net

立刻按 ctrl+D收藏本页

你会得到大惊喜!!

发表于2024-12-28

Reliability Wearout Mechanisms in Advanced CMOS Technologies epub 下载 mobi 下载 pdf 下载 txt 电子书下载 2024

Reliability Wearout Mechanisms in Advanced CMOS Technologies pdf epub mobi txt 电子书下载 2024

图书描述

A comprehensive treatment of all aspects of CMOS reliability wearout mechanisms This book covers everything students and professionals need to know about CMOS reliability wearout mechanisms, from basic concepts to the tools necessary to conduct reliability tests and analyze the results. It is the first book of its kind to bring together the pertinent physics, equations, and procedures for CMOS technology reliability in one place. Divided into six relatively independent topics, the book covers: Introduction to Reliability Gate Dielectric Reliability Negative Bias Temperature Instability Hot Carrier Injection Electromigration Reliability Stress Voiding Chapters conclude with practical appendices that provide very basic experimental procedures for readers who are conducting reliability experiments for the first time. Reliability Wearout Mechanisms in Advanced CMOS Technologies is ideal for students and new engineers who are looking to gain a working understanding of CMOS technology reliability. It is also suitable as a professional reference for experienced circuit design engineers, device design engineers, and process engineers.

Reliability Wearout Mechanisms in Advanced CMOS Technologies 下载 mobi epub pdf txt 电子书