Design, Automation, and Test in Europe pdf epub mobi txt 電子書 下載2025
出版者:
作者:Lauwereins, Rudy (EDT)/ Madsen, Jan (EDT)
出品人:
頁數:528
译者:
出版時間:2008-1
價格:$ 145.77
裝幀:
isbn號碼:9781402064876
叢書系列:
圖書標籤:
- DATE
- Design Automation
- Testing
- VLSI
- EDA
- Europe
- Microelectronics
- CAD
- Semiconductor
- Embedded Systems
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具體描述
In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry.
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