Defects in Microelectronic Materials and Devices pdf epub mobi txt 电子书 下载 2025
出版者:
作者:Fleetwood, Daniel/ Pantolides, Sokrates/ Schrimpf, Ronald D.
出品人:
页数:770
译者:
出版时间:
价格:1258.00 元
装帧:
isbn号码:9781420043761
丛书系列:
图书标签:
- 半导体
- Microelectronics
- Defects
- Materials Science
- Semiconductors
- Device Physics
- Failure Analysis
- Reliability
- VLSI
- Integrated Circuits
- Testing
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具体描述
Uncover the Defects that Compromise Performance and Reliability
As microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.
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