Multi-Chip Module Test Strategies (Frontiers in Electronic Testing) pdf epub mobi txt 电子书下载 2024

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Zorian, Yervant 编

Springer

1997-05-31

167

USD 147.00

Hardcover

9780792399209

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发表于2024-12-29

Multi-Chip Module Test Strategies (Frontiers in Electronic Testing) epub 下载 mobi 下载 pdf 下载 txt 电子书下载 2024

Multi-Chip Module Test Strategies (Frontiers in Electronic Testing) pdf epub mobi txt 电子书下载 2024

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MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

Multi-Chip Module Test Strategies (Frontiers in Electronic Testing) 下载 mobi epub pdf txt 电子书