Essentials of Electronic Testing for Digital, Memory and Mixed-signal VLSI Circuits pdf epub mobi txt 电子书下载 2025

简体网页||繁体网页

☆☆☆☆☆

出版者:Kluwer Academic Pub

作者:Bushnell, Michael L./ Agrawal, Vishwani D.

出品人:

页数:708

译者:

出版时间:2000-11

价格:$ 117.52

装帧:HRD

isbn号码:9780792379911

丛书系列:

图书标签:

下载链接在页面底部

facebook linkedin mastodon messenger pinterest reddit telegram twitter viber vkontakte whatsapp 复制链接

想要找书就要到小美书屋

book.quotespace.org

立刻按 ctrl+D收藏本页

你会得到大惊喜!!

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means "meeting the user's needs at a minimum cost". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.